抄録
We present a new approach for the broadband characterization of dielectric materials in the waveguide-penetration method. The new approach uses only two sets of uncalibrated S-parameter measurements: when the dielectric material is loaded into the waveguide, and when it is unloaded. The theory behind the new approach is based on the properties of similar matrices arising during the measurement. Compared to the previous methods, a network analyzer calibration is not required anymore, resulting in a great measurement simplification. We perform measurements in the X-band to validate the new approach.
