IEICE Communications Express
Online ISSN : 2187-0136
ISSN-L : 2187-0136
Effect of diode operating temperature on conducted-noise spectrum for CCM DC–DC boost converter
Takaaki IbuchiTsuyoshi Funaki
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2014 Volume 3 Issue 9 Pages 269-274

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Abstract

This study focuses on the effect of diode operating temperature on the conducted noise, induced by the reverse recovery current of the diode, of the continuous-current-mode boost DC–DC converter for the Si PiN diode (PiND) and SiC Schottky barrier diode (SBD). The result shows that the SiC SBD exhibits invariant switching behavior and predicts conducted emission level at the operating temperature. The peak reverse recovery current of the Si PiND increases at high operating temperatures. This study indicates that the temperature can affect the noise spectrum distribution for the variation of reverse recovery time and ringing oscillation.

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© 2014 The Institute of Electronics, Information and Communication Engineers
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