Proceedings of JIEP Annual Meeting
The 19th JIEP Annual Meeting
Session ID : 16B-08
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Structural Analysis in Bending Distance of PWB at reflow profile
*Mami NakadateNobutaka ItohMakoto SakairiDaisuke MizutaniMamoru Kurashina
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
As for the PWB of a portable product,it tends to become high density wiring and thinly. The warp of the PWB and PKG causes to unjoint and the bridge of the solder joint in the reflow process. This time, authors design the simple evaluation substrate, and shadow moire technique measurement and the numerical simulation for the temperature profile of the reflow are executed. Temperature dependent material properties are measured,and They are used for the simulation.Then,Authors reports the correlation of the simulation result and the measured value.The warp forecast of the substrate by the simulation become possible.
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© 2005 by The Japan Institute of Electronics Packaging
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