Proceedings of JIEP Annual Meeting
The 19th JIEP Annual Meeting
Session ID : 17A-13
Conference information

Evaluation of Voids in Sn-3.0Ag-0.5Cu solder joint using X-ray CT system
*Kanji TakagiYuji Manba
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Abstract
The availability of X-ray CT system for voids in Sn-3.0Ag-0.5Cu solder joint was evaluated. X-ray CT system was a non-destructive analysis and had a capability of setting cross-section at will. Voids were mainly observed at printed circuit board side in Sn-3.0Ag-0.5Cu solder joint. Area of voids at 245degC was larger than area of voids at 235degC or 240degC, maximum value of re-flow temperature. Therefore, X-ray CT system was useful for evaluation of voids in Sn-3.0Ag-0.5Cu solder joint.
Content from these authors
© 2005 by The Japan Institute of Electronics Packaging
Previous article Next article
feedback
Top