Proceedings of JIEP Annual Meeting
The 22th JIEP Annual Meeting
Session ID : 18C-01
Conference information

Applied AC Voltage for Detecting Open Lead of QFP IC by Monitoring Supply Current
*Akira OnoMasahiro IchimiyaHiroyuki YotsuyanagiMasao TakagiMasaki Hashizume
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Abstract
[in Japanese]
Content from these authors
© 2008 by The Japan Institute of Electronics Packaging
Previous article Next article
feedback
Top