Proceedings of JIEP Annual Meeting
The 22th JIEP Annual Meeting
Session ID : 17B-09
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Host: Japan Institute of Electronics Packaging

Packaing stress induced deterioration mechanism of signal quality in an optical modual
*Atsushi Kitamura, Ken Suzuki, Hideo Miura
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Keywords: semiconductor laser, optical waveguide, strain, frequency shift, polarization
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[in Japanese]
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© 2008 by The Japan Institute of Electronics Packaging
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