Proceedings of JIEP Annual Meeting
The 25th JIEP Annual Meeting
Session ID : 9B-14
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The 25th JIEP Annual Meeting
Fatigue life evaluation Using power device computing model
*kazunori shinoharaqiang Yu
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Abstract
To verify the calculation accuracy of this fatigue life evaluation method for a power device, we investigate how the mesh resolution affects the fatigue life evaluation. This method is based on the finite element method. Therefore, the calculation accuracy of the fatigue life evaluation depends on the mesh resolution. We investigate how the mesh resolution affects the fatigue life evaluation.
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© 2011 The Japan Institute of Electronics Packaging
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