Proceedings of JIEP Annual Meeting
The 26th JIEP Annual Meeting
Session ID : 8A-16
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Host: Japan Institute of Electronics Packaging

The 26th JIEP Annual Meeting
Immunity Evaluation Method for High-speed Signal Transmission using Transient Analysis
*Yusuke Suzuki, Yoshihiro Akeboshi, Naoto Oka, Hideyuki Ohashi, Seiichi Saito
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Keywords: Noise, Simulation, EMC, Shield
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[in Japanese]

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© 2012 The Japan Institute of Electronics Packaging
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