Proceedings of JIEP Annual Meeting
The 28th JIEP Annual Meeting
Session ID : 6B-08
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Host: Japan Institute of Electronics Packaging

The 28th JIEP Annual Meeting
3D-Visual inspection method using color information of the single CCD imaging device
*Kazufumi Sakai, Kazuhiro Nonaka
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Keywords: visual inspection
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[in Japanese]
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© 2014 The Japan Institute of Electronics Packaging
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