Proceedings of JIEP Annual Meeting
The 28th JIEP Annual Meeting
Session ID : 7B-10
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Host: Japan Institute of Electronics Packaging

The 28th JIEP Annual Meeting
Applied Voltage Dependence of Location and Temperature of Hot Spot in Power Si MOSFET
*Risako Kibushi, Tomoyuki Hatakeyama, Shinji Nakagawa, Masaru Ishizuka
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Keywords: Hot Spot
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[in Japanese]
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© 2014 The Japan Institute of Electronics Packaging
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