Proceedings of JIEP Annual Meeting
The 28th JIEP Annual Meeting
Session ID : 5A-19
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Host: Japan Institute of Electronics Packaging

The 28th JIEP Annual Meeting
Investigation on FPGA Malfunctions by Clock Glitch Induced by Disturbance Invasion through Power Cable
*Kengo Iokibe, Kazuhiro Maeshima, Tetsushi Watanabe, Hiroto Kagotani, Yasuyuki Nogami, Yu-ichi Hayashi, Yoshitaka Toyota, Hideaki Sone
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Keywords: Immunity, EMC, Printed board
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[in Japanese]
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© 2014 The Japan Institute of Electronics Packaging
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