e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -XAFS Theory-
XAFS and XMCD Spectra at the Surface and Interface of Ultrathin Films Observed by the Depth-Resolved XAFS/XMCD Technique
Kenta AmemiyaMasako Sakamaki
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2012 Volume 10 Pages 521-524

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Abstract

A depth-resolved X-ray absorption fine structure (XAFS) technique has been developed by using the detection-angle dependence of the effective escape depth of the Auger electrons in the electron-yield XAFS measurement. The technique is applied to a Ni thin film covered with oxygen adsorbates in order to extract the XAFS and X-ray magnetic circular dichroism (XMCD) spectra at the surface layer. The chemical state and the magnetic structure of the surface layer are clarified from the extracted XAFS/XMCD spectra. [DOI: 10.1380/ejssnt.2012.521]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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