Measurements of the Hall Effect on Cu-As-Se-I Amorphous Thin Films

Abstract

The manuscript reports on measurements of the Hall effect performed on Cu_x(As_38.5Se₅₄I_7.5)_100-x amorphous thin films deposited onto glass substrates. Obtained results showed that conductivity of investigated samples is in the range from 10^-12 Ω^-1cm^-1 to 10^-10 Ω^-1cm^-1. Results also pointed to the switching of p-type conductivity for samples with 0 at% and 5 at% of copper to n-type conductivity detected for sample with 25 at% of copper. [DOI: 10.1380/ejssnt.2012.535]