Abstract
The manuscript reports on measurements of the Hall effect performed on Cux(As38.5Se54I7.5)100-x amorphous thin films deposited onto glass substrates. Obtained results showed that conductivity of investigated samples is in the range from 10-12 Ω-1cm-1 to 10-10 Ω-1cm-1. Results also pointed to the switching of p-type conductivity for samples with 0 at% and 5 at% of copper to n-type conductivity detected for sample with 25 at% of copper. [DOI: 10.1380/ejssnt.2012.535]
