Abstract
C-axis epitaxial Cr2O3 thin films were prepared on Pt by radio-frequency (RF) magnetron sputtering method with an in-situ reflection high energy electron diffraction (RHEED) system. Leakage current of Cr2O3 which is deposited at 480°C is the lowest and the value shows 10−6-10−7 A/cm2 order and magnetic hysteresis was observed. This magnetization is induced at Cr2O3/Pt interface and this could be due to compressive stress from Pt substrate, and magnetoelectric (ME) effect could be modulated by interaction between interface and Cr2O3. [DOI: 10.1380/ejssnt.2014.373]