e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ISSS-7-
Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever
Nobuo SatohShigetaka KatoriKei KobayashiShunji WatanabeToru FujiiKazumi MatsushigeHirofumi Yamada
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2015 Volume 13 Pages 102-106

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Abstract

Dynamic-mode atomic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM) has been a powerful tool not only for imaging surface topography but also for investigating surface potential on a nanometer-scale resolution. We have developed DFM/KFM using a microfabricated cantilever with a lead zirconate titanate (PZT) piezoelectric thin film used as a deflection sensor. The observed sample can be in a completely dark environment because no optics are required for cantilever deflection sensing in our experimental setup, which is also equipped with a mechanism to irradiate ultraviolet (UV) light onto the sample. We prepared a platinum-on-silicon substrate and deposited fullerene-derivative (PCBM; [6,6]-Phenyl-C61-Butyric Acid Methyl Ester) film patterns by vacuum evaporation with two shadow masks in crossed directions. The energy band diagram with band-bending, it was created by simultaneously obtaining topographic and surface potential images of the same area using the developed DFM/KFM. [DOI: 10.1380/ejssnt.2015.102]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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