e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Regular Papers
Development of a Simple Probe for Non-Destructive Reversible Electric Contact to nm-Thick Films and 2D Films
Michiko YoshitakeShinjiro YagyuToyohiro Chikyow
Author information

2015 Volume 13 Pages 307-311


A simple probe that is applicable as an electric contact to nm-thick films and 2D films such as graphene and MoS2 without destroying the specimen has been developed. The concept of the development of the probe is based on the repulsive region used in atomic force microscopy technique but without any precise feedback. The robust electric contact with the probe has been demonstrated by biased XPS measurement of a MOS specimen and by resistivity measurement of a 5-layer graphene film on sapphire. It has also proved that there was no detectable damage or contaminations on the specimens after the measurements. [DOI: 10.1380/ejssnt.2015.307]

Information related to the author

この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
Previous article Next article