e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
Regular Papers
Influence of the Shave-off Scan Speed on the Cross-Sectional Shape
So-Hee KangYun KimBunbunoshin TomiyasuMasanori Owari
Author information

2018 Volume 16 Pages 214-217


The shave-off scan method is a unique secondary ion mass spectrometry (SIMS) section processing technique using a gallium focused ion beam (Ga FIB). The sample had a distinctive cross-sectional shape after shave-off scanning, and the slope of the cross section related to the incident angle of the beam that affects sputtering yield. This study investigates sputtering yield as a function of shave-off scan speeds based on cross-sectional shapes examined using a scanning electron microscope (SEM). To conduct a more detailed comparison of the cross sections, the SEM images were converted to an X, Y coordinate system using an in-house program. The sputtering yield decreased as scan speed decreased and incident angle increased. This result opposed the results obtained using conventional raster scanning, and beam profiles could be predicted from the cross-sectional shapes. [DOI: 10.1380/ejssnt.2018.214]

Fullsize Image
Information related to the author
Previous article Next article