e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ISSS-8-
Fast Phase Retrieval from Reflection High Energy Electron Diffraction Intensities during Growth
Takaaki Kawamura
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2018 Volume 16 Pages 97-100

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Abstract

A fast phase retrieval approach from reflection high energy electron diffraction (RHEED) intensities is proposed for monitoring growing surfaces almost in real time. The approach is based on a hybrid input-output algorithm and the processing time is reduced in two ways by taking peculiarities to RHEED intensities during growth. One is to reduce the number of sampling points along the incident beam direction in which the number is much larger than that in the normal direction due to grazing incidence of the beam. The other is to reduce the number of iterations in the retrieving process. The resulting real space objects are well reproduced providing surface morphology during growth approximately in 0.1 s. [DOI: 10.1380/ejssnt.2018.97]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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