e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Scientific Articles
Relation between Sample Area and Accuracy of STM: What Causes the Difficulty in Quantitative Elemental Analysis?
Ryohei TanakaTetsuya KishimotoTakayuki YoshimuraShu KurokawaAkira SakaiJun Kawai
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JOURNAL OPEN ACCESS

2020 Volume 18 Pages 28-31

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Abstract

A Monte Carlo numerical simulation is performed to clarify the reason why an atomic resolution microscope such as a scanning tunneling microscope (STM) cannot give accurately a ppm (parts per million) concentration of elements quantitatively. A relation between the sampling amount and the accuracy has been found. At least 109 atoms are needed to be sampled in order to discriminate the 49 and 50 ppm elemental concentrations. This Monte Carlo result has also been applied to the elemental analysis methods such as ICPAES (inductively-coupled plasma atomic emission spectrometry) and TXRF (total reflection X-ray fluorescence) to clarify the appropriate amount of sampling amount for required precision of quantitative elemental analysis.

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