Preface for the Special Issue of ALC '19

Abstract

The 12th International Symposium “Atomic Level Characterization for New Materials and Devices (ALC ’19)” under the auspices of the 141st Committee on Microbeam Analysis of the Japan Society for the Promotion of Science (JSPS) was held in Miyako Messe, Kyoto, Japan, gathering 265 participants from 13 countries. ALC ’19 was held in conjunction with the 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22). In this symposium, 227 papers in total, including three Tutorials, four Plenaries, and one Keynote, have been presented. Twenty five papers out of them are collected in this special issue.