Fractality of Nanostructured Semiconductor Films

Abstract

We present a model of spatial distribution of electrons, holes, clusters of intrinsic and admixtures (defects of different types) in nanostructured semiconductor thin films. We obtain intermittent, heterogeneous distributions of concentration typical for images of surfaces obtained by scanning tunneling microscopy, atomic-force microscopy and electron microscopy by numerical analyses.[DOI: 10.1380/ejssnt.2007.132]