e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -Handai Nano 2006-
Non-contact atomic force microscopy investigation of the (1 × 1) and (√3 × √3) phases on the Pb/Si(111) surface
A. OhisoY. SugimotoK. MizutaM. AbeS. Morita
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2007 Volume 5 Pages 67-73

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Abstract
The (1 × 1) and (√3 × √3) phases of the Pb/Si(111) surface are investigated at room temperature using non-contact atomic force microscopy. The topographic height difference between these phases is determined to be 1.6±0.1 Å, which is larger than the theoretical value (1.2 Å) previously predicted. Kelvin probe force microscopy measurements show that the work function on the (1 × 1) region is 201±16 meV higher than that on the (√3 × √3) region. The effective dipole moments by electron transfer from the first layer Si atom to the Pb adatom on the (1 × 1) phase is discussed. We also succeed in obtaining atomically resolved images of the two phases, and demonstrate that the (1 × 1) phase has small atomic corrugation compared with the (√3 × √3) phase when imaging at same tip condition and the same acquisition parameters. [DOI: 10.1380/ejssnt.2007.67]
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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
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