e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ISSS-5-
Atomic-Scale Analysis of Self-Positioning Nanostructures
Y. NishidateG. P. Nikishkov
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JOURNAL FREE ACCESS

2008 Volume 6 Pages 301-306

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Abstract

We performed an atomic-scale analysis of self-positioning nanostructures using the atomic-scale finite element method (AFEM) and Kriging interpolation technique. Equilibrium atomic configurations are determined for varying structure thicknesses and results are compared with the continuum mechanics solution under plane strain conditions. We observed significant decrease of the equilibrium curvature radius when the structure thickness is less than 40 nm. It is found that large compressive strains near the free surface affect the distribution of strains as the structure size decreases. [DOI: 10.1380/ejssnt.2008.301]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
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