Scanning Probe Microscopy of ZnO Nanobelts

Abstract

We present an AFM and STM-STS investigation of the surface of ZnO nanobelts grown by chemical vapour deposition. AFM images showed a type 1 (high aspect ratio) nanobelt lying across a type 2 (low aspect ratio) nanobelt, bending at an angle of 20.9° without breaking. Terraces 10 atomic layer thick were also observed, with step edges running along the [0010] direction. STM images confirmed the AFM results while STS curves and current maps showed higher conductivity for the ZnO nanobelts than for the oxidised silicon surface, as well as an n-type behaviour. [DOI: 10.1380/ejssnt.2009.323]