Abstract
We have investigated step-in mode non-contact atomic force microscopy (NC-AFM) for precise measurement of fine and steep structures having high aspect ratios. We have proposed piconewton controlled step-in mode AFM using NC-AFM to suppress bending and slipping of the probe on a slope. We have constructed a prototype of the step-in mode NC-AFM using a quadrature frequency demodulator for detecting the resonant frequency shift of the cantilever. Experiments revealed that the system was able to perform step-in mode NC-AFM even in air. We obtained a faithful AFM image of the steep structure of a dry-etched Si pattern without bending or slipping of the probe at approximately 2-3 pN using a sharp, slim probe, as compared with a step-in mode contact AFM image obtained at 1, 5, and 10 nN. [DOI: 10.1380/ejssnt.2011.122]
