e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -NSS-6-
Nano-Scale Characterization of Poly-Si Gate on High-k Gate Stack Structures by Scanning Photoemission Microscopy
S. ToyodaY. NakamuraK. HoribaH. KumigashiraM. OshimaK. Amemiya
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2011 Volume 9 Pages 224-227


We have investigated poly-Si gate pattern on HfO2/SiO2/Si stack structures by scanning photoemission microscopy using synchrotron radiation. Gate-pattern images have been successfully obtained by scanning the sample position during acquisitions of core-level photoemission spectra. Si 2p, Hf 4f, and O 1s core-level spectra systematically change for different sample positions, which suggests that light source focused by the zone plate is effectively utilized for nano-scale characterization of chemical states in device-pattern structures. We have also demonstrated that etching velocities of HfO2 films on a Si substrate and shallow trench isolation vary when exposing the poly-Si gate pattern to dry etching processes. [DOI: 10.1380/ejssnt.2011.224]

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