Abstract
X-ray fluorescence holography (XFH) provides three dimensional atomic images around specified elements. The XFH uses atoms as a wave source or monitor of interference field within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence. [DOI: 10.1380/ejssnt.2011.363]
