日本液晶学会討論会講演予稿集
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
1999年 日本液晶学会討論会
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PAb06 エリプソメトリー法によるSSFLCの応答特性の解析
服部 広和奥谷 聡木村 宗広赤羽 正志田所 利康鳥海 弥和
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p. 130-131

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The properties of the Surface Stabilized Ferroelectric Liquid Crystal Devices (SSFLCD) were characterized empirically by the optical polarization states measured by transmition and/or total reflection ellipsometry. Under a certain triangular wave electric field, the frequency dependence of the hysteresis curves of amplitude ratio (Ψ) were observed. Numerical calculation based on a continuum theory for SSFLCD and 4 × 4 matrix method were also performed. It is also found that the parameters such as cell gap, pretilt angle, elastic constant and spontaneous polarization affect on the hysteresis properties.

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© 1999 日本液晶学会
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