主催: 日本液晶学会
会議名: 1999年 日本液晶学会討論会
開催地: 富山大学 五福キャンパス
開催日: 1999/09/29 - 1999/10/01
p. 258-259
We investigated infrared ellipsometry as a new technique to characterize molecular orientation of rubbed polyimide film. In polarization spectra of reflected infrared beam from rubbed polyimide film on glass substrate, characteristic structures corresponding vibrations of -O-, C-N-C and benzene. Anisotropy of polarization was also observed at the wavenumber corresponding vibrations of C-O-C, C-N-C and benzene. It is expected that infrared reflection ellipsometry can determine polyimide molecular orientation by combining with reflection ellipsometry of visible light.