日本液晶学会討論会講演予稿集
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
1999年 日本液晶学会討論会
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PCb01 赤外エリプソメトリによる配向膜評価の検討
廣沢 一郎
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p. 258-259

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We investigated infrared ellipsometry as a new technique to characterize molecular orientation of rubbed polyimide film. In polarization spectra of reflected infrared beam from rubbed polyimide film on glass substrate, characteristic structures corresponding vibrations of -O-, C-N-C and benzene. Anisotropy of polarization was also observed at the wavenumber corresponding vibrations of C-O-C, C-N-C and benzene. It is expected that infrared reflection ellipsometry can determine polyimide molecular orientation by combining with reflection ellipsometry of visible light.

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© 1999 日本液晶学会
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