主催: 日本液晶学会
会議名: 1999年 日本液晶学会討論会
開催地: 富山大学 五福キャンパス
開催日: 1999/09/29 - 1999/10/01
p. 98-99
Electro-optical properties of In-Plane Switching mode were investigated by using ellipsometry. To analyze the response of LC director in the bulk, we used the transmission ellipsometry. In order to analyze the director motion at LC-alignment film interface, we used the total reflection ellipsometry. It was found that; when the applied electric field was increased, the change of the phase difference Δ and the angle of amplitude ratio Ψ was increased, and the change of Δ and Ψ did not exhibit a monotonic behavior.