抄録
Electro-optical properties of In-Plane Switching mode were investigated by using ellipsometry. To analyze the response of LC director in the bulk, we used the transmission ellipsometry. In order to analyze the director motion at LC-alignment film interface, we used the total reflection ellipsometry. It was found that; when the applied electric field was increased, the change of the phase difference Δ and the angle of amplitude ratio Ψ was increased, and the change of Δ and Ψ did not exhibit a monotonic behavior.