PAa13 偏光解析を用いた液晶の屈折率とその波長分散の評価

抄録

We demonstrate a new application to evaluate the refractive indices and those wave-length dispersions by using the ellipsometry. To get information of the bulk in LC, we used especially the transmission ellipsometry. By mesuring the phase difference Δ and the angle of amplitude ratio Ψ, and fitting numerical calculation based on the 4×4 matrix method, it is found that the refractive indices and their wave-length dispersion can be evaluated quantitatively.