抄録
The near-infrared interference method (NIR-IM) enables the cell gap of reflective color-LCDs to be determined non-destructively and, therefore, this method can be used in the manufacture process. Since the reflective color-LCD has a multi-layer structure, the spectrum obtained by the NIR-IM contains a complex oscillating interference pattern. In the present study, the multi-layer analysis was applied to a cell gap measurement of a reflective color-LCD. The interference spectrum was reproduced theoretically using multi-layer information together with the refractive index and thickness of each layer.
