日本液晶学会討論会講演予稿集
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
2000年 日本液晶学会討論会
会議情報

3A02 偏光解析法を用いたスメクティック液晶自己保持膜の層構造に関する研究
*奥本 忠隆木村 宗弘赤羽 正志松橋 信明
著者情報
会議録・要旨集 フリー

p. 409-410

詳細
抄録
The layer structure of thin MHPOBC Free-Standing Film (FSF) was investigated by the transmission ellipsometry. In various films with thickness between 2 and 10 smectic layers, the quantized film thickness in SmA phase and the relation between the tilt angle and the film thickness in SmC_A phase was measured. It was found that the layer thickness in SmA phase is 2.5nm which is much smaller than that in the bulk sample measured by the X-ray study. The layer thickness seems not to depend on the tilt angle. It is considered that surface interaction of FSF may affect the layer thickness and tilt angle.
著者関連情報
© 2000 日本液晶学会
前の記事 次の記事
feedback
Top