Analysis of the Reverse Twist Stability in an IPS Mode

Abstract

A reverse twist defect deteriorates a picture quality of an In-Plane Switching (IPS) mode display. We have proposed a simple method to evaluate the reverse twist stability using one-dimensional sine curve director profiles. The calculated stability has been corresponded to the observed phenomena. Using this method, the stability dependence on the device parameters can be investigated with facility and the deterioration due to the reverse twist defect can be predicted.