Proceedings of Japanese Liquid Crystal Society Annual meeting
Online ISSN : 2432-5988
Print ISSN : 1880-3490
ISSN-L : 1880-3490
2004 Japanese Liquid Crystal Society annual meeting
Session ID : PC01
Conference information
Novel surface profiler system for inspection of flat panel display
*Munehiro Kimura, Oo Tet Naing, Tadashi Akahane, Tetsuya Iwata
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Abstract
Novel surface profiler system for inspection of the display components is demonstrated. In the case of the liquid crystal display, for example, not only the flatness of the alignment film but also the quality of rubbing can be inspected. This instrument is applicable for EL glass substrate as well as LCD and PDP. To visualize the shape of the back plane, no preparatory treatment (viz. remove the alignment film) is required. That is, in-line panel inspection of the real product can be realized.
Content from these authors
© 2004 Japanese Liquid Crystal Society
Previous article Next article
feedback
Top