Measurement of Twist Distortion Elasticity of SmC* Using Dynamic Light Scattering Measurement under Reflection Scattering Geometry

Abstract

It is difficult to measure the dynamics of liquid crystals contributed to the scattering vector normal to the substrates using dynamic light scattering (DLS) because of the reflection from the surface of the substrates. In this paper, we succeeded in measuring the fluctuation of the helix of SmC* related to the twist distortion of the C-director using DLS under the reflection geometry by our development. This method is characteristic from the viewpoint that twist elasticity can be measured without the perturbation such as an electric field.