共鳴軟X線散乱を用いた液晶相構造の構造解析の試み

抄録

Resonant X-ray scattering (RXS) is sensitive to the system symmetry and is useful to analyze the precise orientation structure, which is difficult to analyze by conventional X-ray scattering. In order to enable the RXS measurement with many liquid crystal compounds, we started to perform resonance soft X-rays scattering with carbon K-edge energy. In this paper, we will show you a part of the results.