Pattern formation in conductive nematic liquid crystals II

Abstract

We perform numerical simulations for a spontaneous pattern formation of umblical defects which are obtained by the reorientation of homeotropically aligned nematic liquid crystals with negative dielectric anisotropy. In this presentation we focus on the stability of the pattern formation by adjusting various physical parameters and external fields. By comparing simulated results with experimental ones, we examine the detailed physical mechanism to stabilize the pattern.