高プレティルト角を持つネマティック液晶と基板間の方位角アンカリングエネルギーの新しい測定法

抄録

A novel method is proposed for mesuring the deviation of director azianuthal angle from the orientation easy axis at the interface between the substrate and an LC layer in a twisted nematic liquid crystal cell. Due to the method the deviation of azimuthal angle is able to measure accurately even in the case when the dispersion of the rotatary power is significant i.e. the retardation Δnd/λ is smaller than the Morguin limit. This method is applied to measure the azimuthal anchoring energy for a nematic liquid crystal algned on the substrate with a pretilt angle higher than 80 degree. As a result an extremely low azimuthal anchoring energy in the order of 10^-9[J/m²] was obtained.