主催: 液晶討論会世話人会, 日本化学会, 高分子学会, 応用物理学会
会議名: 第22回 液晶討論会
回次: 22
開催地: 九州大学 工学部
開催日: 1996/10/05 - 1996/10/07
Temperature dependence of smectic layer thickness in antiferroelectric liquid crystals has been investigated. We classified into three types of temperature dependence of layer thickness. Small change of layer thickness made liquid crystal mixtures have small amount of zig-zag defects. As a result, the alignment in the first stage nearly remains unchanged in thermal shock atmosphere.