Simplified High Electric Field Technique for Anchoring Measurement (II)

Abstract

Anchoring properties of a liquid crystal at the interface has always been one of the most intriguing topics ofresearch in physics and applications of liquid crystals. This is because the anchored orientation imposed at theinterface serves as the indispensable boundary condition for determining the configuration of liquid crystal specimen. Moreover, due to the emergence of photoaligning processes and polymer dispersed systems in which the control of anchoring strength is believed to be vital, the demand for quantitative characterization of surface anchoring is becoming even more acute in recent years.