2003 Volume 71 Issue 2 Pages 114-116
In the near field of an illuminated scanning probe tip with a dimension much smaller than a wavelength of the incident light a field enhancement is possible. This effect is similar to the field enhancement on small metal particles investigated in SERS (Surface Enhanced Raman Spectroscopy). In this article a formerly developed and successfully applied BEM (Boundary Element Method) calculation of the electric potential and field is used to compute respective values of an experimental setup arranged by Pettinger et al. which is similar to our experiments focussing on single molecule Raman spectroscopy. The calculated field enhancement factors are compared with the experimentally determined. The results show high electric field enhancement factors in the vicinity of the metallic tip.