抄録
A new technique of topographic scanning scanning electron microscopy was used to study the influence of tracking with the stylus on contact profilometry of paper surface. Microscopically determined profile curves were analyzed in terms of Fourier components. By selecting a wavelength range below a cut-off wavelength, the profile change caused by the tracking with the stylus was detected effectively. With an optimal cut-off wavelength of 16μm, the deformation of the surface of a woodfree paper by stylus tracking was clearly shown. This cut-off wavelength corresponds to three times of the radius of curvature of the stylus tip.
