抄録
Solution-cast thin films of poly (ethylene 2, 6-naphthalate) (PEN) were isothermally crystallized at 190°C on the highly oriented ultra-thin friction-transfer layer of polytetrafluoroethylene (PTFE), after being melted at 300°C. Transmission electron microscopy (TEM) of the films showed that PEN crystallized in an oriented fashion on the layer. Selected-area electron diffraction (ED) indicated that the crystals in the PEN films are mostly the α-form, as expected from our thermal condition for crystallization. The ED pattern from the untilted specimen was characterized by the fairly intense arc-shaped 010 reflection on the equator. A series of ED patterns, which were obtained from the same specimen area tilted at various angles around the axis parallel or perpendicular to the chain axis of PTFE in a TEM column, suggested that the crystallites of PEN α-form are preferentially oriented with their chain axis being parallel to the chain axis of PTFE and moreover, with their (100) planes being parallel to the surface of the PTFE layer.
