Host: Abstracts of Annual Meeting of the Geochemical Society of Japan
Name : Abstracts of Annual Meeting of the Geochemical Society of Japan
Number : 71
Date : September 18, 2024 - September 20, 2024
Pages 214-
Soft X-ray Self Absorption Structure (SX-SAS) analysis is a method for analyzing chemical bonding states similar to X-ray absorption near edge structure (XANES) and electron energy loss near edge structure (ELNES) by visualizing self-absorption effects from multiple characteristic X-ray spectra measured with a soft X-ray emission spectrometer (SXES) at different electron beam accelerating voltages and analyzing structures near the absorption edge. In this study, we report the results of observing absorption edge shifts and structural changes of Fe in mineral samples as the oxidation number of Fe changes, in order to utilize SX-SAS as a useful analytical method for earth and planetary science.