2002 Volume 31 Issue 5 Pages 275-282
Electron back-scattering diffraction (EBSD) is a unique tool to obtain crystallographic information from specimens in a scanning electron microscope (SEM). Crystalline phases, crystal orientation and the relationship between the crystal orientation and morphology of the specimens are readily determined by analyzing Kikuchi patterns with dedicated software. Several applications in mineralogy, where EBSD combined with SEM imaging is very useful and convenient, are described.