高さの方向がX線に完浴しない円柱状試料の吸収および体積補正
1983 年 16 巻 Special 号 p. 93-98
詳細
1983 年 16 巻 Special 号 p. 93-98
Diffraction intensities from a crystal at very high temperature, such as those above 1000°C, are not rarely contaminated with those from a binder, such as zirconium cement, with which the crystal is fixed to a rod, thus hindering accurate determination of the crystal structure. Such a disadvantage can be evaded by the use of a crystal sample having the shape of a thin needle, 5-10 mm long. As the crystal in this case is not completely bathed in the X-ray beam, a new formulation is required to correct diffraction intensities for absorption and change in volume seen from the beam. A procedure of these corrections for a cylindrical sample has been described for the geometry of four-circle dif f ractometer. A computer program has been provided for the procedure.
