抄録
Many materials exhibit topotaxy in the processes of phase transformations and these pro-cesses appear from X-ray diffraction patterns to be changes from single crystals to other single crystals. It is, therefore, possible to study processes of topotactic phase transformations by X-ray single crystal diffractometry. A four-circle diffractometer and its software system, suitable to measure intensity distribution of one dimensional region in the reciprocal space simultaneously, have been developed in order to study topotactic phase transformations. The difractometer was constructed with a combination of a white X-ray source and a Si (Li) solid state detector. The software system was made to suit these combination. Examples of measurements by the system were also given.
