鉱物学雜誌
Online ISSN : 1883-7018
Print ISSN : 0454-1146
ISSN-L : 0454-1146
透過電子顕微鏡用の新しいイメージングプレートシステムについて
上原 誠一郎
著者情報
ジャーナル フリー

1997 年 26 巻 4 号 p. 221-226

詳細
抄録

A new Imaging Plate (IP) system for transmission electron microscopy (TEM), which has a pixel size of 25μm×25μm, has been developed by Fuji Photo Film Co., Ltd. (1994). In this paper the new IP system is briefly reviewed and tested. The characteristics of the new IP are high sensitivity, wide dynamic range and linear sensitivity compared with those of photographic film for TEM. It is very useful for high-resolution TEM of electron-beam sensitive minerals. Furthermore, digitally recorded TEM images are convenient for image processing.

著者関連情報
© 日本鉱物科学会
前の記事
feedback
Top