NIPPON GOMU KYOKAISHI
Print ISSN : 0029-022X
General Reviews
Morphological Observation of Soft Material by using Electron Microscope
Sawa ARAKIAtsushi KATO
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JOURNAL FREE ACCESS

2017 Volume 90 Issue 12 Pages 583-590

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Abstract

An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects. In particular, in this report, we introduce preprocessing methods and observation cases specialized in soft materials such as plastics and rubber.

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© 2017 The Society of Rubber Industry, Japan
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